This inventor holds 2 USPTO granted patents. Top assignees: National Institute of Radiological Sciences, Seiko Precision Inc.. Active years: 2005-2009.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Nakahiro Yasuda. Retrieved from https://idiyas.com/inventor/nakahiro-yasuda
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Average Co-Inventor Count = 3.3
ph-index = 1
Forward Citations = 8(Granted Patents)
Location History:
- Chiba, JP (2005)
- Chiba-ken, JP (2009)
Company Filing History:
2 out of 61 
National Institute of Radiological Sciences
2 out of 254 Seiko Precision Inc.
where one patent can have more than one assignee
Years Active: 2005-2009
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2 patents (USPTO):Explore Patents
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Nakahiro Yasuda. Retrieved from https://idiyas.com/inventor/nakahiro-yasuda
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]