The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Mar. 28, 2003
Nakahiro Yasuda, Chiba, JP;
Yoshihiro Honma, Chiba-ken, JP;
Nakahiro Yasuda, Chiba, JP;
Yoshihiro Honma, Chiba-ken, JP;
National Institute of Radiological Sciences, Chiba, JP;
Seiko Precision Inc., Narashino, JP;
Abstract
A microscope apparatus has a sample table for supporting a sample and being mounted to undergo movement in a horizontal direction. A line sensor acquires a line image for each of a series of measuring positions of the sample in accordance with movement of the sample at a constant speed by one measuring width of the line sensor in the horizontal direction. An image processing device produces an image of the sample based on the line images acquired by the line sensor. A focusing device has a light-projecting member for projecting light onto the sample at a position forward of a leading side of an imaging range of the line sensor in the horizontal direction to prevent light reflected by the sample as a result of the projected light from being incident on and interfering with the line images acquired by the line sensor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile