This inventor holds 1 USPTO granted patent. Top assignee: Orbotech Limited. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Innovations by Nai-Wei Chen in Defect Detection Technology.
Introduction
Nai-Wei Chen is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of defect detection technology, particularly through his innovative patent. His work focuses on improving the accuracy of defect location reporting, which is crucial in various manufacturing processes.
Latest Patents
Nai-Wei Chen holds a patent for a "Panel design to improve accurate defect location report." This invention describes an array checker (AC) that includes software designed to implement a specific method. By utilizing this method, the array checker can detect the location of a defect and compensate for any shifts in that defect. The process involves generating reference lines on a panel, capturing an image of the panel through voltage imaging, and calculating offsets to ensure precise defect location.
Career Highlights
Nai-Wei Chen is currently employed at Orbotech Limited, a company known for its advanced technology solutions in the electronics manufacturing industry. His role involves leveraging his expertise to enhance the capabilities of defect detection systems.
Collaborations
Throughout his career, Nai-Wei Chen has collaborated with talented individuals such as Yueh-Nan Chen and Chih-Chang Lai. These collaborations have contributed to the advancement of technology in their respective fields.
Conclusion
Nai-Wei Chen's innovative work in defect detection technology exemplifies the importance of precision in manufacturing processes. His contributions continue to influence the industry and pave the way for future advancements.