Chicago, IL, United States of America

Mykhailo Pevnyi

This inventor holds 1 USPTO granted patent. Top assignee: Kent State University. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mykhailo Pevnyi. Retrieved from https://idiyas.com/inventor/mykhailo-pevnyi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Mykhailo Pevnyi: Innovator in Surface Stress Measurement

Introduction

Mykhailo Pevnyi is a notable inventor based in Chicago, IL (US). He has made significant contributions to the field of stress measurement through his innovative inventions. His work focuses on developing advanced apparatuses that enhance the accuracy and efficiency of measuring surface profiles.

Latest Patents

One of Mykhailo Pevnyi's key patents is titled "Apparatus for measuring surface profile of normal and shear stress." This apparatus is designed to measure normal and shear stress at a surface. It includes a substrate and a plurality of sensing units on the substrate. Each sensing unit features a mechanical transducer with a receiving surface and a sensing surface, along with multiple normal force sensors positioned between the sensing surface and the substrate. This invention showcases his expertise in creating precise measurement tools.

Career Highlights

Mykhailo Pevnyi is affiliated with Kent State University, where he contributes to research and development in his field. His role at the university allows him to collaborate with other experts and advance the study of stress measurement technologies.

Collaborations

Some of Mykhailo's coworkers include Tianyi Guo and Fred Minkowski. Their collaboration fosters a dynamic research environment that encourages innovation and the sharing of ideas.

Conclusion

Mykhailo Pevnyi's work in developing an apparatus for measuring surface stress is a testament to his innovative spirit and dedication to advancing technology. His contributions are valuable to the field and highlight the importance of precise measurement in engineering applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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