The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2022
Filed:
Sep. 25, 2018
Applicant:
Kent State University, Kent, OH (US);
Inventors:
Mykhailo Pevnyi, Chicago, IL (US);
Tianyi Guo, Kent, OH (US);
Fred Minkowski, Kent, OH (US);
Vincent Hetherington, Independence, OH (US);
Hiroshi Yokoyama, Hudson, OH (US);
Peter Palffy-Muhoray, Kent, OH (US);
Assignee:
KENT STATE UNIVERSITY, Kent, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01); G01L 5/1623 (2020.01); A43B 17/04 (2006.01); G01L 1/20 (2006.01); G01N 3/24 (2006.01); A43B 3/34 (2022.01);
U.S. Cl.
CPC ...
G01L 5/1623 (2020.01); A43B 3/34 (2022.01); A43B 17/04 (2013.01); G01L 1/205 (2013.01); G01N 3/24 (2013.01);
Abstract
An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.