Hiroshi Yokoyama

Title: Hiroshi Yokoyama: Innovator in Surface Measurement and Liquid Crystal Technology

Introduction

Hiroshi Yokoyama is a notable inventor based in Hudson, OH (US). He has made significant contributions to the fields of surface measurement and liquid crystal technology. With a total of 4 patents, his work has advanced the understanding and application of stress measurement and photoalignment methods.

Latest Patents

Yokoyama's latest patents include an "Apparatus for measuring surface profile of normal and shear stress" and a "Recursive photoalignment method." The first patent describes an apparatus designed to measure normal and shear stress at a surface, featuring a substrate and multiple sensing units. Each sensing unit is equipped with a mechanical transducer that has both a receiving surface and a sensing surface, along with several normal force sensors positioned between the sensing surface and the substrate. The second patent outlines a photoalignment method that involves photoaligning a first liquid crystal cell and utilizing it as a mask for the photoalignment of a second liquid crystal cell. This innovative method aims to enhance spatial dynamic range or reduce pitch.

Career Highlights

Throughout his career, Yokoyama has worked at Kent State University, where he has contributed to various research projects and initiatives. His expertise in the field has allowed him to develop groundbreaking technologies that have practical applications in both academic and industrial settings.

Collaborations

Yokoyama has collaborated with talented individuals such as Mykhailo Pevnyi and Tianyi Guo. These partnerships have fostered a creative environment that has led to the development of innovative solutions in their respective fields.

Conclusion

Hiroshi Yokoyama's contributions to the fields of surface measurement and liquid crystal technology highlight his role as a significant inventor. His patents and collaborations reflect a commitment to advancing technology and innovation.