This inventor holds 1 USPTO granted patent. Top assignee: Fuji Electric Co., Ltd.. Active years: 1984.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1984
Title: Mutsuo Sawaguchi: Innovator in Infrared Measurement Technology
Introduction
Mutsuo Sawaguchi is a notable inventor based in Sagamihara, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative infrared thickness measuring device. His work has implications for various industries that require precise measurement of thin films.
Latest Patents
Mutsuo Sawaguchi holds a patent for an infrared thickness measuring device. This device utilizes infrared rays to measure the thickness of thin films. The design includes an infrared source positioned on one side of the film, with a disk featuring two apertures that is rotatably mounted between the infrared source and the film. Band-pass filters are placed over the apertures, and a concave hemispherical reflector is positioned to enhance the measurement accuracy. A light collecting guide with a photoelectric sensor is located on the opposite side of the film to measure the intensity of the infrared rays. This innovative approach allows for precise thickness measurements in various applications.
Career Highlights
Mutsuo Sawaguchi is associated with Fuji Electric Co., Ltd., where he has contributed to advancements in measurement technologies. His work has been recognized for its technical merit and practical applications in the industry. With a patent count of 1 patent, he continues to be an influential figure in his field.
Collaborations
Mutsuo Sawaguchi has collaborated with Takabumi Fumoto, working together to enhance the development of measurement technologies. Their partnership has fostered innovation and contributed to the success of their projects.
Conclusion
Mutsuo Sawaguchi's contributions to infrared measurement technology exemplify the importance of innovation in achieving precision in various industries. His patent for the infrared thickness measuring device showcases his commitment to advancing measurement techniques. His work continues to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile