The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1984
Filed:
May. 29, 1981
Takabumi Fumoto, Yokosuka, JP;
Mutsuo Sawaguchi, Sagamihara, JP;
Fuji Electric Co., Ltd., Kanagawa, JP;
Abstract
A device for measuring the thickness of a thin film or the like is provided using infrared rays. A source of infrared rays is positioned on one side of the film. A disk with two apertures is rotatably mounted between the infrared source and the film, with band-pass filters positioned over the apertures in the disk. A concave hemispherical reflector with a reflector surface facing the film is positioned between the infrared source and the film. A hole is formed in the center of the concave reflector through which the infrared rays pass. A convex reflector is positioned between the film and the concave reflector and has a reflecting surface facing the concave reflector. A light collecting guide with a photoelectric sensor is positioned on the opposite side of the film from the infrared source for measuring the intensity of the infrared rays.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile