Penang, Malaysia

Murtuza Ali Lakhani

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Murtuza Ali Lakhani. Retrieved from https://idiyas.com/inventor/murtuza-ali-lakhani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Murtuza Ali Lakhani: Innovator in Integrated Circuit Testing

Introduction

Murtuza Ali Lakhani is a notable inventor based in Penang, Malaysia. He has made significant contributions to the field of integrated circuits, particularly in the area of built-in self-testing (BIST) logic. His innovative approach has led to the development of a unique method and apparatus that enhances the testing capabilities of integrated circuits.

Latest Patents

Murtuza holds a patent for a "Method and apparatus for interactive built-in-self-testing." This invention discloses methods and apparatus for interactive built-in self-testing with user-programmable test patterns. The invention operates within the context of an integrated circuit (IC) that includes BIST logic and a test interface circuit. The BIST logic executes a BIST routine for testing the IC, while the test interface allows for the input of external test patterns from an external logic circuit. The design includes flag storage elements that indicate the availability of test patterns and control logic that manages the execution of the BIST routine based on the flags set.

Career Highlights

Murtuza Ali Lakhani is currently employed at Intel Corporation, a leading technology company known for its innovations in semiconductor manufacturing. His work at Intel has allowed him to collaborate with other talented professionals in the field, including his coworker Yan Xu. Together, they contribute to advancing technology in integrated circuits and testing methodologies.

Collaborations

Murtuza has worked alongside Yan Xu, leveraging their combined expertise to enhance the development of integrated circuit testing solutions. Their collaboration exemplifies the importance of teamwork in driving innovation within the technology sector.

Conclusion

Murtuza Ali Lakhani's contributions to integrated circuit testing through his patented methods demonstrate his commitment to innovation in the field. His work at Intel Corporation and collaborations with colleagues highlight the collaborative nature of technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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