San Jose, CA, United States of America

Murali Narsimhan

This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2004.


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Murali Narsimhan: Innovator in Thin Film Characterization

Introduction

Murali Narsimhan is a notable inventor based in San Jose, CA. He has made significant contributions to the field of integrated circuit devices, particularly in the characterization of thin films. His innovative work has led to the development of methods and apparatus that enhance the understanding of material properties in semiconductor technology.

Latest Patents

Murali Narsimhan holds a patent for "Methods and apparatus for characterizing thin films." This patent describes a process where a target with multiple layers is scanned using an x-ray emission inducer. The x-ray emissions, which are characteristic of the materials in the target, are measured to determine the thickness and composition of the layers. The method includes the use of multiple beam energies or continuously varying beam energies to conduct the scan. This innovation is crucial for improving the accuracy of thin film analysis in integrated circuits.

Career Highlights

Murali Narsimhan is associated with Kla-Tencor Technologies Corporation, a company known for its advanced semiconductor manufacturing equipment. His work at Kla-Tencor has positioned him as a key player in the development of technologies that support the semiconductor industry. His expertise in thin film characterization has contributed to the advancement of integrated circuit design and manufacturing processes.

Collaborations

Murali has collaborated with several professionals in his field, including Gary Janik and Roger L Kroeze. These collaborations have fostered an environment of innovation and have led to the successful development of new technologies in thin film characterization.

Conclusion

Murali Narsimhan's contributions to the field of thin film characterization are significant and impactful. His patent and work at Kla-Tencor Technologies Corporation demonstrate his commitment to advancing semiconductor technology. His innovative methods continue to influence the industry and pave the way for future developments.

Profile summary based on public USPTO records.
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