Akaiwa-gun, Japan

Muneo Kawabata


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Innovations of Muneo Kawabata in Boundary Scan Testing Technology

Introduction

Muneo Kawabata is an accomplished inventor hailing from Akaiwa-gun, Japan. With a keen focus on technological advancements, he holds a patent for a boundary scan testing device. This device showcases an innovative approach to testing, setting it apart from traditional methods.

Latest Patents

Kawabata's significant contribution to the field is his patent for a boundary scan testing device. Contrary to typical boundary scan devices, his invention does not employ a boundary scan test vector generating function for producing test vectors. Instead, it operates using test vectors produced externally, enhancing its versatility and application in boundary scan testing.

Career Highlights

Muneo Kawabata is associated with Hewlett-Packard Company, where he plays a vital role in advancing testing technology. His expertise in the field has enabled him to contribute valuable innovations that improve the efficiency and reliability of electronic testing processes.

Collaborations

Throughout his career, Kawabata has collaborated with esteemed colleagues, including Joseph M Lagrotta and James L Hutchinson. These partnerships have fostered an environment of innovation and have significantly enriched the development of testing solutions within the company.

Conclusion

Muneo Kawabata's inventive prowess, particularly his boundary scan testing device, reflects his commitment to advancing technology in the field of electronics. His contributions continue to influence the landscape of testing methodologies, highlighting his importance as an inventor in today's ever-evolving technological realm.

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