The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 1998

Filed:

Feb. 26, 1997
Applicant:
Inventors:

Joseph M Lagrotta, Fort Collins, CO (US);

James L Hutchinson, Boulder, CO (US);

Daniel G Bihn, Fort Collins, CO (US);

Kenneth P Parker, Fort Collins, CO (US);

David J Rustici, Loveland, CO (US);

Keisuke Takaura, Ikomashi, JP;

Muneo Kawabata, Akaiwagun, JP;

Hiroyuki Ohki, Okayamaken, JP;

Takanori Uematsu, Tokyo, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 2232 ;
Abstract

A boundary scan testing device is presented which does not provide a boundary scan test vector generating function for producing boundary scan test vectors corresponding to the boundary scan device under test. Instead, the boundary scan testing device operates based on test vectors produced elsewhere.


Find Patent Forward Citations

Lagrotta, Joseph. (1998). Boundary scan testing device (U.S. Patent No. 5751737). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5751737

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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