Hamamatsu, Japan

Motoyuki Watanabe


Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 53(Granted Patents)


Location History:

  • Shizuoka, JP (1990 - 2008)
  • Hamamatsu, JP (1993 - 2014)

Company Filing History:


Years Active: 1990-2014

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10 patents (USPTO):Explore Patents

Title: Motoyuki Watanabe: Innovator in Film Thickness Measurement Technology

Introduction

Motoyuki Watanabe is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of film thickness measurement technology, holding a total of 10 patents. His innovative work has advanced the capabilities of measuring semiconductor films, which are crucial in various technological applications.

Latest Patents

Watanabe's latest patents include a film thickness measurement device and a film thickness measurement method. The film thickness measurement apparatus features a measurement light source that supplies measurement light containing wavelength components over a predetermined band to a semiconductor film. It incorporates a spectroscopic optical system and a photodetector that detects intensities of output light formed by superimposing reflected light components from both the upper and lower surfaces of the semiconductor film. The film thickness analysis section is designed to obtain a temporal change in film thickness based on the spectral waveforms of the output light detected at different time points. Another patent describes a similar apparatus that uses two different wavelengths to analyze the film thickness based on the phase difference between the detected intensities of the interfering light components.

Career Highlights

Throughout his career, Watanabe has worked with notable companies such as Hamamatsu Photonics K.K. and Hamamatsu Photonics Kabushiki Kaisha. His work in these organizations has allowed him to develop and refine his innovative technologies in film thickness measurement.

Collaborations

Watanabe has collaborated with esteemed colleagues, including Musubu Koishi and Teruo Takahashi. Their combined expertise has contributed to the advancement of measurement technologies in the semiconductor industry.

Conclusion

Motoyuki Watanabe's contributions to film thickness measurement technology have established him as a key figure in the field. His innovative patents and collaborations reflect his commitment to advancing measurement techniques in semiconductor applications.

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