The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
Jun. 07, 2001
Motoyuki Watanabe, Hamamatsu, JP;
Kazuya Iguchi, Hamamatsu, JP;
Motoyuki Watanabe, Hamamatsu, JP;
Kazuya Iguchi, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
In a fluorescence measuring method and apparatus, a sample S is irradiated with pulsed pumping light supplied from a pumping light source. Fluorescence generated by the sample S is detected by a photodetector by way of a condensing optical system and a spectroscope. The fluorescence time waveform is subjected to a data analysis in a data processing unit in a controller. This computes waveform data and physical quantities such as fluorescence lifetime. The pumping light time waveform is fixedly arranged with respect to a time axis used for data analysis. Fitting calculations are carried out while moving the fluorescence time waveform and fitting range from an initial position earlier than a pumping light peak to a later end position, and optimal measurement waveform data is selected according to a predetermined selection criterion. Waveform data is thus computed accurately and efficiently regardless of fluctuations in the fluorescence time waveform.