The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1990
Filed:
Dec. 29, 1988
Musubu Koishi, Shizuoka, JP;
Etsuo Tsujimura, Shizuoka, JP;
Motoyuki Watanabe, Shizuoka, JP;
Yutaka Tsuchiya, Shizuoka, JP;
Hamamatsu Photonics Kabushiki Kaisha, Shizuoka, JP;
Abstract
Optical waveform observing apparatus including a sampling streak tube to which is applied an incident light beam having a waveform to be observed. An electron beam corresponding to the incident light beam is repetitively deflected in the streak tube, in response to a repetitive deflecting trigger signal, to sample the electron beam. The repetitive deflection of the electron beam is periodically stopped for a first time period. An integration circuit integrates data outputted by the streak tube. A subtraction circuit subtracts the integration of streak tube data outputted during the first time period from the integration of streak tube data outputted during a second time period when the repetitive beam deflection is not stopped, so that background noise and dark currents are not included in the subtraction result.