Motonari Tateno

Title: Motonari Tateno: Innovator in Optical Inspection Technology

Introduction

Motonari Tateno is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of optical inspection technology. With a total of 3 patents to his name, Tateno's work focuses on enhancing the precision and efficiency of optical inspection methods.

Latest Patents

Tateno's latest patents include an "Optical Inspection Apparatus and Optical Inspection Method." This invention involves an optical inspection apparatus designed to inspect an inspection target surface by irradiating it with light. The apparatus features a condensing and scanning optical system that condenses light from a source onto the target surface in a minute spot shape. It also scans this condensed light across the surface, while a phase change information detection apparatus captures optical phase change information in the irradiated area.

Another notable patent is the "Optical Reticle Substrate Inspection Apparatus and Beam Scanning Method of the Same." This apparatus utilizes a laser and acousto-optical elements to scan a laser beam. It generates a virtual image with a concave lens effect, which is then imaged onto a reticle substrate that is the object of inspection. The design includes a concave lens that magnifies the laser beam in a perpendicular direction to the scanning direction, enhancing the inspection process.

Career Highlights

Motonari Tateno is currently employed at NEC Corporation, where he continues to innovate in the field of optical technologies. His work has been instrumental in advancing inspection methods that are critical for various applications in technology and manufacturing.

Collaborations

Tateno collaborates with Hideyuki Moribe, a fellow innovator, to further enhance the capabilities of their optical inspection technologies. Their partnership exemplifies the collaborative spirit that drives innovation in the tech industry.

Conclusion

Motonari Tateno's contributions to optical inspection technology reflect his dedication to innovation and excellence. His patents not only advance the field but also pave the way for future developments in optical inspection methods.