Ditzingen, Germany

Monika Heisterkamp

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Monika Heisterkamp: Innovator in Measuring Technology

Introduction

Monika Heisterkamp is a notable inventor based in Ditzingen, Germany. She has made significant contributions to the field of measuring technology, particularly with her innovative measuring apparatus designed for analyzing measuring mediums. Her work exemplifies the intersection of engineering and practical application in scientific measurement.

Latest Patents

Monika holds 1 patent for her invention titled "Measuring apparatus for analyzing a measuring medium." This apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The design features a measurement window that directs radiation into a measuring region while blocking measuring radiation from that region. Additionally, the apparatus integrates a physical or chemical sensor to detect measurands and output measurement signals. An electronic measurement unit processes the data collected from both the receiving device and the sensor, showcasing her innovative approach to measurement technology.

Career Highlights

Throughout her career, Monika has worked with prominent companies in the industry. She has been associated with Endress+Hauser Conducta GmbH & Co. KG and Endress+Hauser Conducta Gesellschaft für Mess- und Regeltechnik MBH & Co. KG. Her experience in these organizations has allowed her to refine her skills and contribute to advancements in measurement technology.

Collaborations

Monika has collaborated with notable colleagues such as Joachim Mannhardt and Judith Falk. These partnerships have likely enriched her work and fostered innovation in her projects.

Conclusion

Monika Heisterkamp's contributions to measuring technology through her innovative patents and collaborations highlight her role as a significant inventor in her field. Her work continues to influence advancements in measurement apparatus design and functionality.

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