The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Nov. 13, 2018
Endress+hauser Conducta Gmbh+co. KG, Gerlingen, DE;
Joachim Mannhardt, Eschach, DE;
Judith Falk, Leinfelden-Echterdingen, DE;
Monika Heisterkamp, Ditzingen, DE;
Endress+Hauser Conducta GmbH+Co. KG, Gerlingen, DE;
Abstract
The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.