Los Altos, CA, United States of America

Mohammed Massoodi

This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro Devices Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mohammed Massoodi. Retrieved from https://idiyas.com/inventor/mohammed-massoodi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Mohammed Massoodi: Innovator in Semiconductor Emission Imaging

Introduction

Mohammed Massoodi is a notable inventor based in Los Altos, CA. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on methods for detecting defects in semiconductor devices.

Latest Patents

Massoodi holds a patent titled "Method and system for locating chip-level defects through emission imaging of a semiconductor device." This patent describes a system that inspects semiconductor devices by detecting emissions from both the frontside and backside simultaneously. The emissions detected can indicate potential defects within the semiconductor device, enhancing the reliability of semiconductor manufacturing.

Career Highlights

He is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work at AMD has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in semiconductor technology.

Collaborations

Throughout his career, Massoodi has collaborated with talented professionals, including Boon Yong Ang and Mehrdad Mahanpour. These collaborations have fostered a creative environment that encourages innovation and problem-solving in the semiconductor field.

Conclusion

Mohammed Massoodi's contributions to semiconductor emission imaging demonstrate his commitment to innovation and excellence in technology. His patent and work at Advanced Micro Devices Corporation highlight his role as a key player in advancing semiconductor inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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