Nashville, TN, United States of America

Mohamed T El-Haddad

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Vanderbilt University. Active years: 2022-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mohamed T El-Haddad. Retrieved from https://idiyas.com/inventor/mohamed-t-el-haddad

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2022-2024

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3 patents (USPTO):Explore Patents

Title: Innovations of Mohamed T El-Haddad

Introduction

Mohamed T El-Haddad is a notable inventor based in Nashville, TN (US). He has made significant contributions to the field of imaging systems and optical materials. With a total of 3 patents, his work focuses on advancing technology in medical imaging and material evaluation.

Latest Patents

El-Haddad's latest patents include innovative systems and methods for image-based guidance using automated instrument tracking. This technology analyzes en face image frames to determine the location of instruments in imaging planes, enhancing the precision of depth-based imaging systems. Another patent involves non-destructive evaluation of optical material properties, utilizing interferometry measurements to characterize internal surfaces of lenses. This method includes advanced techniques such as sphere-fitting and ray-tracing to identify glass types based on optical parameters.

Career Highlights

El-Haddad is affiliated with Vanderbilt University, where he continues to push the boundaries of research and innovation. His work has garnered attention for its practical applications in medical and optical fields.

Collaborations

He collaborates with Yuankai Tao, contributing to the advancement of their shared research interests.

Conclusion

Mohamed T El-Haddad's contributions to imaging technology and optical material evaluation demonstrate his commitment to innovation. His patents reflect a deep understanding of complex systems and a drive to improve existing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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