The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Jan. 10, 2020
Applicant:

Vanderbilt University, Nashville, TN (US);

Inventors:

Yuankai Tao, Nashville, TN (US);

Mohamed T. El-Haddad, Nashville, TN (US);

Assignee:

Vanderbilt University, Nashville, TN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); A61B 90/00 (2016.01); G01B 9/02091 (2022.01); G06T 3/40 (2024.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); G01B 9/02091 (2013.01); G06T 3/40 (2013.01); G06T 7/70 (2017.01); A61B 2034/2065 (2016.02); A61B 2090/373 (2016.02); G06T 2207/10028 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Systems and methods for image-based guidance using automated instrument tracking. An en face image frame, generated from en face image data captured by a first imaging system (e.g., an SER imaging system), is analyzed to determine a location of an instrument in the first imaging plane. A control signal is then generated for the movement stage to control the scanning movement of a depth-based imaging system (e.g., an OCT imaging system) based on the determined location of the instrument. In some implementations, a trained neural-network is used to determine the location of the instrument based on the en face image frame and, in some implementations, the control signal adjusts the speed of the scanning movement to capture image data at a higher density7 at areas corresponding to the determined location of the instrument.


Find Patent Forward Citations

Tao, Yuankai. (2024). Automated instrument-tracking and adaptive image sampling (U.S. Patent No. 12029501). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12029501

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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