Kanagawa, Japan

Miwa Fukunaga

This inventor holds 1 USPTO granted patent. Top assignee: Olympus Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miwa Fukunaga. Retrieved from https://idiyas.com/inventor/miwa-fukunaga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Miwa Fukunaga: Innovator in Microscope Technology

Introduction

Miwa Fukunaga is a notable inventor based in Kanagawa, Japan. She has made significant contributions to the field of microscopy, particularly through her innovative designs that enhance the functionality of microscope systems.

Latest Patents

Fukunaga holds a patent for a "Microscope system with plural attachable/detachable objective lens units." This invention allows for a plurality of mounting devices to be selectively exchanged while maintaining the same parfocal distances for objective lenses among these devices. The microscope system includes a main unit and multiple attachable/detachable objective lens units that can be selectively attached. The main unit features a raising mechanism that moves the attached objective lens unit along the optical axis. The design incorporates a revolver or nosepiece that can be attached to the main unit, allowing for easy interchangeability of objective lenses.

Career Highlights

Miwa Fukunaga is associated with Olympus Corporation, a leading company in optical and imaging technology. Her work has contributed to advancements in microscopy, making it more versatile and user-friendly.

Collaborations

Fukunaga collaborates with Yasunori Makara, who is also a key figure in the development of innovative microscopy solutions. Their partnership has led to significant advancements in the field.

Conclusion

Miwa Fukunaga's contributions to microscope technology exemplify her innovative spirit and dedication to enhancing scientific tools. Her patent reflects a commitment to improving the functionality and usability of microscopy systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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