The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Jul. 16, 2012
Yasunori Makara, Tokyo, JP;
Miwa Fukunaga, Kanagawa, JP;
Yasunori Makara, Tokyo, JP;
Miwa Fukunaga, Kanagawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A plurality of mounting devices are selectively exchanged while keeping the same parfocal distances for objective lenses among these mounting devices. A microscope system includes a microscope main unit and a plurality of attachable/detachable objective lens units that are selectively attached to the microscope main unit. The microscope main unit includes raising mechanism that can move the attached objective lens unit in an optical axis direction. The plurality of objective lens units have a revolver or a nosepiece that can be attached to the microscope main unit and an objective lens that can be mounted on the revolver or the nosepieces in an attachable/detachable manner. Distances from an attachment position in the microscope main unit for the revolver or the nosepiece to focal positions of the objective lenses are set to be mutually equal among the objective lens units.