Gunma, Japan

Mitsuru Hayamizu

This inventor holds 1 USPTO granted patent. Top assignee: Shin-Etsu Chemical Co., Ltd.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuru Hayamizu. Retrieved from https://idiyas.com/inventor/mitsuru-hayamizu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations by Mitsuru Hayamizu in Transparent Object Inspection

Introduction

Mitsuru Hayamizu is a notable inventor based in Gunma-ken, Japan. He has made significant contributions to the field of inspection technology, particularly focusing on transparent objects. His innovative approach has led to advancements in inspection accuracy and efficiency.

Latest Patents

Hayamizu holds a patent for a "Method, apparatus, and system for inspecting transparent objects." This patent describes an inspection method where a transparent object is irradiated with light from a light source. The surface or interior of the transparent object is then inspected by observing the transmitted light on the side opposite to the light source. The inspection apparatus includes a transparent-object-moving unit, an irradiation unit, and a detection unit. This setup allows for improved inspection accuracy and efficiency.

Career Highlights

Mitsuru Hayamizu is associated with Shin-Etsu Chemical Co., Ltd., where he has been instrumental in developing innovative inspection technologies. His work has contributed to enhancing the quality control processes within the company.

Collaborations

Hayamizu has collaborated with Yoshihiko Nagata, furthering the development of inspection technologies and methodologies.

Conclusion

Mitsuru Hayamizu's contributions to the field of transparent object inspection demonstrate his commitment to innovation and quality. His patented methods and apparatuses are paving the way for more efficient inspection processes in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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