The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Mar. 09, 1998
Mitsuru Hayamizu, Gunma-ken, JP;
Yoshihiko Nagata, Gunma-ken, JP;
Shin-Etsu Chemical Co., Ltd., Tokyo, JP;
Abstract
In an inspection method for a transparent object, a transparent object is irradiated with light from a light source, and the surface or interior of the transparent object is inspected by observing transmitted light on the side of the transparent object that is opposite to the light source. An inspection apparatus for a transparent object includes a transparent-object-moving unit, an irradiation unit, and a detection unit. The transparent-object-moving unit moves a transparent object to an inspection position and fixes the transparent object in the inspection position. The irradiation unit emits light from a light source disposed on one side of the transparent object so as to irradiate light onto the transparent object fixed in the inspection position by the transparent-object-moving unit. The detection unit is located on the side of the transparent object opposite the light source and has a detector for detecting light that has been emitted from the light source and has passed through the transparent object. The inspection method and the inspection apparatus realize improved inspection accuracy and inspection efficiency.