Osaka, Japan

Mitsunobu Ota

This inventor holds 1 USPTO granted patent. Top assignee: Minolta Camera Kabushiki Kaisha. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsunobu Ota. Retrieved from https://idiyas.com/inventor/mitsunobu-ota-fm2nxchy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 84(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Mitsunobu Ota: Innovator in Optical Density Detection

Introduction

Mitsunobu Ota is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of optical density detection. His innovative work has led to the development of a unique optical density detector that enhances measurement accuracy.

Latest Patents

Mitsunobu Ota holds 1 patent for his invention of an optical density detector. This device comprises a first light source that emits light in a wavelength region where it is minimally absorbed by specific materials in a sample. Additionally, it features a second light source that emits light in a wavelength region where absorption occurs. The detector is designed to measure the difference in absorbance between the two light sources, which varies with the density of the specific material.

Career Highlights

Ota is associated with Minolta Camera Kabushiki Kaisha, where he has been instrumental in advancing optical measurement technologies. His work has been recognized for its practical applications in various industries, enhancing the precision of optical measurements.

Collaborations

Mitsunobu Ota has collaborated with notable colleagues, including Akio Yamanishi and Hitoshi Kamezawa. Their combined expertise has contributed to the successful development of innovative optical technologies.

Conclusion

Mitsunobu Ota's contributions to optical density detection exemplify the impact of innovation in technology. His work continues to influence the field, paving the way for future advancements in optical measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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