The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 1991

Filed:

Aug. 03, 1988
Applicant:
Inventors:

Akio Yamanishi, Osaka, JP;

Hitoshi Kamezawa, Osaka, JP;

Takao Sakai, Osaka, JP;

Sadafusa Tsuji, Osaka, JP;

Mitsunobu Ota, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356402 ; 356407 ; 356420 ; 356425 ; 250226 ;
Abstract

An optical density detector which comprises a first light source for emitting a first light which belongs to a wavelength region in which the first light is hardly absorbed by a specific material contained in a sample, a second light source for emitting a second light which belongs to a wavelength region in which the second light is absorbed, substantially as compared with the first light, by the specific material, wherein a peak-wavelength of the second light is shifted by change of a temperature and change of an absorption of the specific material caused by the peak-wavelength shift is characteristic of a linear equation with a gentle grade, light receiving device for measuring a quantity of the first and the second lights which are transmitted through the sample, an arithmetic unit for calculating difference of absorbance between the first light and the second light of which both change depending on the density of the specific material, a temperature measuring device for measuring the temperature of the first and the second light sources and the light receiving device, or measuring the ambient temperature around the first and the second light sources and the light receiving device and compensation unit for compensating the difference of absorbance which is calculated by the arithmetic unit, with the absorption coefficient of the specific material at a shifted peak-wavelength of the second light, wherein the shifted peak-wavelength is calculated on the basis of a measured value measured by said temperature measuring device.


Find Patent Forward Citations

Yamanishi, Akio. (1991). Optical density detector (U.S. Patent No. 4986665). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4986665

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