This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Mitutoyo Corporation. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Mitsuhisa Nakano: Innovator in Contour Measurement Technology.
Introduction
Mitsuhisa Nakano is a prominent inventor based in Nagoya, Japan. He is known for his contributions to the field of measurement technology, particularly through his innovative designs and patents. His work has significantly impacted the way contour measurements are conducted in various industries.
Latest Patents
Mitsuhisa Nakano holds a patent for a contour measuring apparatus. This apparatus features an arm with a stylus at its distal end, which is swingable with respect to a cabinet. It includes an attitude change mechanism that alters the arm's position within a swing range. Additionally, a stopper is designed to contact the arm when it approaches the installation part of an object to be measured. The controller operates the attitude change mechanism based on a power-off command, returning the arm to a mechanical limit position where it contacts the stopper. This innovative design enhances the accuracy and efficiency of contour measurements.
Career Highlights
Mitsuhisa Nakano is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has allowed him to develop cutting-edge technologies that are widely used in various sectors, including manufacturing and quality control.
Collaborations
Mitsuhisa Nakano has collaborated with notable colleagues such as Hiroyuki Hidaka and Hideki Kai. These partnerships have fostered a creative environment that encourages innovation and the development of advanced measurement solutions.
Conclusion
Mitsuhisa Nakano's contributions to contour measurement technology exemplify his dedication to innovation and precision. His patent for the contour measuring apparatus showcases his ability to solve complex measurement challenges. Through his work at Mitutoyo Corporation and collaborations with talented colleagues, Nakano continues to influence the field of measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
