This inventor holds 1 USPTO granted patent and 3 published patent applications and 1 EPO patent. Top assignees: Marunaka Co., Ltd., Yamaguchi University. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Mitsugu Nakagawa: Innovator in Leakage Inspection Technology
Introduction
Mitsugu Nakagawa is a notable inventor based in Obu, Japan. He has made significant contributions to the field of leakage inspection technology. His innovative approach has led to the development of a unique apparatus and method for detecting leaks in various tested bodies.
Latest Patents
Mitsugu Nakagawa holds a patent for a "Leakage inspection apparatus and leakage inspection method." This invention provides a comprehensive solution for inspecting the flow rate of leakage from a tested body disposed in a tested-body chamber. The apparatus includes liquid supplying and pressurizing means for delivering a probe liquid into the tested-body chamber and pressurizing it to a high pressure of 0.1 MPa or more. Additionally, it features vacuum evacuation means and a quadrupole mass spectrometer. This technology allows for the measurement of the concentration of a probe medium leaked from the tested body, enabling accurate flow rate assessments.
Career Highlights
Throughout his career, Nakagawa has worked with esteemed institutions such as Yamaguchi University and Marunaka Co., Ltd. His experience in these organizations has contributed to his expertise in leakage inspection technologies.
Collaborations
Mitsugu Nakagawa has collaborated with notable colleagues, including Setsuo Yamamoto and Katsushi Tsuge. Their combined efforts have further advanced the field of leakage inspection.
Conclusion
Mitsugu Nakagawa's innovative contributions to leakage inspection technology demonstrate his commitment to enhancing safety and efficiency in various applications. His patent and collaborations reflect his significant impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile