This inventor holds 1 USPTO granted patent. Top assignee: Leica Microsystems (Suzhou) Technology Co., Ltd.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Minquan Li - Innovator in Optical Inspection Technology
Introduction
Minquan Li is a notable inventor based in Suzhou, China. He has made significant contributions to the field of optical inspection technology. His innovative approach has led to the development of a unique processing device that enhances the quality inspection of samples.
Latest Patents
Minquan Li holds a patent for a "Processing device and inspection apparatus for optical inspection and corresponding methods." This device is designed to be communicatively coupled to a camera of an optical inspection device and a user interface. It receives input data from the user interface and/or the camera, providing output data to the user interface. The device is also connected to a storage device, allowing it to access instruction data for optical quality inspection. The instructions guide users on the type of inspection to be performed on specific samples. Additionally, the processing device can receive quality report data and image data, storing them in the storage device for further analysis.
Career Highlights
Minquan Li is currently employed at Leica Microsystems (Suzhou) Technology Co., Ltd. His work at this esteemed company has allowed him to focus on advancing optical inspection technologies. His innovative contributions have positioned him as a key player in the field.
Collaborations
Minquan Li collaborates with talented coworkers, including YuanPing Zhou and Linqi Jiao. Their combined expertise fosters a creative environment that drives innovation in optical inspection technology.
Conclusion
Minquan Li's contributions to optical inspection technology through his patent and work at Leica Microsystems highlight his role as an influential inventor. His innovative processing device is set to enhance the quality inspection processes in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile