The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Mar. 01, 2021
Leica Microsystems (Suzhou) Technology Co., Ltd., Suzhou, CN;
Linqi Jiao, Suzhou, CN;
Chunxin Yang, Suzhou, CN;
Fei Zhang, Suzhou, CN;
Yuanping Zhou, Suzhou, CN;
Minquan Li, Suzhou, CN;
Wei Zhao, Suzhou, CN;
Shengwei Feng, Suzhou, CN;
LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., LTD., Suzhou, CN;
Abstract
A processing device to be used for optical inspection of samples is configured to be communicatively coupled to a camera of an optical inspection device and to a user interface, to receive input data from the user interface and/or from the camera, to provide output data to the user interface, to be communicatively coupled to a storage device, to provide instructions, by accessing instruction data stored at the storage device, for optical quality inspection of samples to be performed by a user via the user interface. The instructions include instructions regarding what kind of optical quality inspection to be performed on which sample. The processing device is further configured to receive quality report data from the optical quality inspection via the user interface, and/or image data of images acquired by the camera, and to store the quality report data and/or the image data in the storage device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile