Isehara, Japan

Minoru Chiba

This inventor holds 1 USPTO granted patent. Top assignee: Sokkisha Co., Ltd.. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Minoru Chiba. Retrieved from https://idiyas.com/inventor/minoru-chiba-cxd9spmf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Minoru Chiba: Innovator in Electronic Distance Measurement

Introduction

Minoru Chiba is a notable inventor based in Isehara, Japan. He has made significant contributions to the field of electronic distance measurement. His innovative approach has led to the development of a unique apparatus that enhances the accuracy and efficiency of distance measurement technologies.

Latest Patents

Chiba holds a patent for an "Apparatus for mounting target plate on reflector for electronic distance." This invention features a target plate that is mounted on a reflector body support unit. The design allows the target plate to be slid into and engaged with guide grooves formed in the upstanding arms of a U-shaped frame. Locking screws, each with a knob end manipulatable by hand and a forward enlarged end, are utilized to secure the target plate in position.

Career Highlights

Minoru Chiba is associated with Sokkisha Co., Ltd., a company known for its advancements in measurement technology. His work has been instrumental in developing tools that improve the precision of electronic distance measurement.

Collaborations

Chiba has collaborated with Hideya Kawachi, contributing to the innovative projects at Sokkisha Co., Ltd. Their teamwork has fostered advancements in measurement technology.

Conclusion

Minoru Chiba's contributions to electronic distance measurement through his innovative patent demonstrate his commitment to enhancing measurement technologies. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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