Mingzhao Tong

Title: Innovations by Mingzhao Tong in Memory Device Testing

Introduction

Mingzhao Tong is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of memory device testing, holding three patents that showcase his innovative approach to technology. His work focuses on enhancing the efficiency and effectiveness of memory devices, particularly in testing and control mechanisms.

Latest Patents

Mingzhao Tong's latest patents include a circuit and method for testing memory devices. This invention provides a circuit designed to test a memory device that has multiple blocks addressable via a plurality of address lines. The circuit includes a test pattern generator that receives test data and generates both a write test vector and a read test vector. Additionally, a multiplexer is used to transmit the write test vector to a specific memory block, while a comparator checks the read test vector against the output from the memory block.

Another notable patent is a circuit and method for controlling internal test mode entry of an ASRAM chip. This invention features an address code comparator that detects whether inputted address codes match a predefined validation code. It also includes a test mode detector and a test mode clock generator, which work together to facilitate the ASRAM chip's entry into an internal test mode. This innovation simplifies the testing process by utilizing existing pins of the ASRAM chip.

Career Highlights

Mingzhao Tong is currently employed at Integrated Silicon Solution (Shanghai), Inc