The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Dec. 04, 2013
Applicant:

Integrated Silicon Solution (Shanghai), Inc, Shanghai, CN;

Inventor:

Mingzhao Tong, Shanghai, CN;

Assignee:

INTEGRATED SILICON SOLUTION (SHANGHAI), INC., Pudong New Area, Shanghai, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/46 (2006.01); G11C 29/18 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01);
Abstract

A circuit and method for controlling internal test mode entry of an Asynchronous Static Random Access Memory (ASRAM) chip wherein the circuit includes an address code comparator for detecting whether address codes inputted via an address bus of the ASRAM chip match a predefined validation code; a test mode detector for determining whether to let the ASRAM chip enter into an internal test mode; a test mode clock generator for generating a clock signal for the test mode decoder; and a test mode decoder for generating a test control signal. The circuit of the present application uses the existing pins of the ASRAM chip to input a special section of codes to trigger the ASRAM to enter into its internal test mode, thereby reducing the difficulty of testing the products.


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