This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignees: Aem Singapore Pte. Ltd., Inspirain Technologies Pte Ltd. Active years: 2019-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019-2021
Title: Minglei Cui: Innovator in Signal Measurement Technology
Introduction
Minglei Cui is a notable inventor based in Singapore, recognized for his contributions to the field of signal measurement technology. With a total of 2 patents, he has developed innovative methods and systems that enhance the measurement capabilities of devices under test (DUT).
Latest Patents
Cui's latest patents include a "System and method for temporal signal measurement of device under test (DUT)" and a "Method and system for measuring a propagation delay and transmittance of a device under test (DUT)." The first patent describes a measurement system that utilizes a reference clock synthesizer to generate a master reference clock signal. This system includes a transmitter unit that connects to the DUT and a measurement control system that generates test signal patterns. The receiver unit detects the signal and produces a digital output based on the received data. The second patent outlines a method for measuring propagation delay using two measurement units that compare periodic signals transmitted through the DUT, allowing for accurate calculations of delay.
Career Highlights
Minglei Cui has worked with several companies, including Inspirain Technologies Pte Ltd and Aem Singapore Pte. Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement systems.
Collaborations
Cui has collaborated with notable professionals in his field, including Harshang Nileshkumar Pandya and Xing Zhu. These collaborations have likely enriched his work and led to further innovations in signal measurement technology.
Conclusion
Minglei Cui's innovative work in signal measurement technology demonstrates his significant contributions to the field. His patents reflect a commitment to advancing measurement techniques, making him a valuable figure in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile