The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
May. 15, 2017
Inspirain Technologies Pte Ltd, Singapore, SG;
Harshang Nileshkumar Pandya, Singapore, SG;
Minglei Cui, Singapore, SG;
INSPIRAIN TECHNOLOGIES PTE LTD, Singapore, SG;
Abstract
The invention provides a method and system for measuring a propagation delay of a device under test (DUT) using a first measurement unit and a second measurement unit. A first periodic signal transmitted from the first measurement unit via the DUT is received at the second measurement unit as a first delayed periodic signal. The first delayed periodic signal is then compared with a second periodic signal at the second measurement unit to generate the second comparison phase output. Similarly, the second periodic signal transmitted from the second measurement unit via the DUT is received at the first measurement unit as a second delayed periodic signal. The second delayed periodic signal is then compared with the first periodic signal at the first measurement unit to generate the first comparison phase output. Thereafter, the propagation delay is calculated by combining the first comparison phase output and the second comparison phase output.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile