Mingcheng Zong

Title: The Innovative Contributions of Mingcheng Zong

Introduction

Mingcheng Zong is a prominent inventor based in Beijing, China. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing inspection methods for semiconductor devices, which are crucial for the advancement of electronic components.

Latest Patents

Mingcheng Zong holds a patent for "Laser-assisted electron-beam inspection for semiconductor devices." This innovative patent describes methods and apparatuses for laser-assisted electron-beam inspection (EBI). The apparatus includes an EBI device and a laser illumination device. The EBI device features an e-beam source that emits an incident e-beam, a deflector that directs the e-beam onto the surface of a semiconductor device, and an electron detector that captures the emergent electrons generated by the incident e-beam. The laser illumination device consists of a laser source that generates a laser and a guiding device that projects the laser onto the semiconductor device. This technology allows the laser to modify the emergent electrons, enabling a PN junction of an NMOS in the semiconductor device to enter a conduction state in a positive mode of the EBI apparatus. Mingcheng Zong has 1 patent to his name.

Career Highlights

Mingcheng Zong is currently employed at Zhongke Jingyuan Electron Limited, where he continues to develop innovative solutions in the semiconductor industry. His expertise in electron-beam inspection techniques has positioned him as a valuable asset in his field.

Collaborations

Mingcheng Zong has collaborated with notable colleagues, including Shiguang Li and Jie Guo. Their combined efforts contribute to the advancement of semiconductor technologies and inspection methods.

Conclusion

Mingcheng Zong's innovative work in laser-assisted electron-beam inspection showcases his commitment to improving semiconductor technology. His contributions are vital for the ongoing development of electronic devices.