Company Filing History:
Years Active: 2012-2013
Title: The Innovative Contributions of Ming Zhang
Introduction
Ming Zhang is a notable inventor based in Wayland, MA (US), recognized for his significant contributions to the field of material characterization and imaging technologies. With a total of 2 patents, he has developed innovative methods that enhance the understanding and analysis of materials through advanced radiation techniques.
Latest Patents
Ming Zhang's latest patents include groundbreaking technologies such as "Backscatter energy analysis for classification of materials based on positional non-commutativity." This patent describes a system and methods for characterizing regions within or on an inspected object, allowing for the distinction between lower-Z and higher-Z materials using penetrating radiation. The method generates two detector signals that facilitate the identification of materials based on their effective atomic numbers, ultimately producing images that reveal the composition of the inspected object.
Another significant patent is "Three-dimensional mapping based on scattered penetrating radiation." This invention outlines methods for creating a tangible image of an inspected object by illuminating it with multiple sources of penetrating radiation. The resulting signals provide information about the object's dimensions and composition, enhancing the visualization of materials in three-dimensional space.
Career Highlights
Ming Zhang is currently employed at American Science and Engineering, Inc., where he applies his expertise in developing advanced imaging technologies. His work has contributed to the company's reputation as a leader in the field of material analysis and security imaging.
Collaborations
Throughout his career, Ming Zhang has collaborated with esteemed colleagues such as Peter John Rothschild and Omar Al-Kofahi. These partnerships have fostered innovation and the exchange of ideas, further advancing the technologies in which he specializes.
Conclusion
Ming Zhang's contributions to the field of material characterization and imaging technologies are noteworthy. His innovative patents and collaborative efforts continue to push the boundaries of what is possible in material analysis.