The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Jun. 03, 2010
Applicants:

Ming Zhang, Wayland, MA (US);

Omar Al-kofahi, Woburn, MA (US);

Wamiq Ahmed, Woburn, MA (US);

Inventors:

Ming Zhang, Wayland, MA (US);

Omar Al-Kofahi, Woburn, MA (US);

Wamiq Ahmed, Woburn, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for a tangible image of an inspected object. An object is illuminated with at least two sources of penetrating radiation that generate respective pencil beams and define respective viewing points and view planes. Post-interaction penetrating radiation due to the respective sources is used to generate signals based on respective views of the inspected object, and thus derive information with respect to a dimension transverse to the first view plane based on the second signal. A tangible image of the inspected object is then displayed depicting information with respect at least to the first view plane and the transverse dimension.


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