Ming Yan

Title: The Innovations of Ming Yan

Introduction

Ming Yan is a notable inventor based in Waukesha, WI (US). He has made significant contributions to the field of computed tomography, particularly in enhancing the quality of CT images. His innovative approach combines advanced detector systems with deep learning techniques to improve medical imaging.

Latest Patents

Ming Yan holds a patent for "Systems and methods for computed tomography." This patent describes a computed tomography (CT) detector system that includes a layer of energy integrating detectors (EID) positioned below a layer of photon counting (PC) sensors. The system is designed to enhance the quality of CT images by correcting PC data using EID data, denoising, and increasing the resolution of images through a deep learning convolutional neural network (CNN). This technology represents a significant advancement in medical imaging, allowing for more accurate diagnostics.

Career Highlights

Throughout his career, Ming Yan has worked with prominent companies in the healthcare sector. He has been associated with GE Precision Healthcare LLC and General Electric Company, where he has contributed to the development of innovative medical technologies. His work has had a lasting impact on the field of medical imaging.

Collaborations

Ming Yan has collaborated with esteemed colleagues, including Jiahua Fan and Changlyong Kim. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas in the field of computed tomography.

Conclusion

Ming Yan's contributions to computed tomography exemplify the importance of innovation in medical technology. His patent and career achievements highlight his dedication to improving healthcare through advanced imaging techniques. His work continues to influence the field and pave the way for future advancements.