The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Jul. 26, 2022
GE Precision Healthcare Llc, Wauwatosa, WI (US);
Jiahua Fan, New Berlin, WI (US);
Changlyong Kim, Brookfield, WI (US);
Ming Yan, Waukesha, WI (US);
Scott D. Slavic, Sussex, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Nicholas R. Konkle, Sussex, WI (US);
GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);
Abstract
Systems and methods are provided for increasing a quality of computed tomography (CT) images. In one embodiment, a computed tomography (CT) detector system comprises a layer of energy integrating detectors (EID) arranged below a layer of photon counting (PC) sensors with respect to an incoming x-ray, where a number of the PC sensors exceeds a number of the EID detectors; and an image processing unit configured to correct PC data using EID data, and denoise and increase a resolution of an image reconstructed from EID data and PC data using a deep learning convolutional neural network (CNN) trained on pairs of images, each pair of images including a target image reconstructed from a first signal from the layer of PC sensors, and an input image reconstructed from a second signal from the layer of EID detectors, the EID data and PC data acquired concurrently from a same patient ray path.