Ming-Chung Wu

Title: Ming-Chung Wu and Integrated Circuit Scan Clock Domain Allocation.

Introduction

Ming-Chung Wu is an inventor associated with Yilan, Taiwan. Wu’s listed patent concerns organizing functional clock domains into scan clock domains for integrated circuit testing.

Latest Patents

Wu is credited with 1 patent: “Method of Integrated Circuit Scan Clock Domain Allocation and Machine Readable Media Thereof.” The method uses an integrated circuit’s netlist and timing constraints to identify the number of crossing paths between pairs of functional clock domains and produce a clock domain report. Based on that report, the functional clock domains are grouped and assigned to scan clock domains.

Career Highlights

Wu is associated with Realtek Semiconductor Inc. The patent reflects work on scan-clock allocation, a design consideration for integrated circuit testing.

Collaborations

Shuo-Fen Kuo and Ying-Yen Chen are listed as Wu’s coworkers. The available information does not specify their roles in the patent.

Conclusion

Ming-Chung Wu’s listed invention addresses the allocation of integrated circuit clock domains for scan testing and is associated with Realtek Semiconductor Inc.