Location History:
- Taipei, TW (2001 - 2002)
- Vancouver, WA (US) (2002 - 2004)
Company Filing History:
4 out of 40,927 
1 out of 56 
Years Active: 2001-2004
Title: The Innovations of Ming-Chun Chou
Introduction
Ming-Chun Chou is a notable inventor based in Vancouver, WA (US). He has made significant contributions to the field of photolithography and semiconductor technology. With a total of 5 patents to his name, Chou's work has had a considerable impact on the industry.
Latest Patents
One of his latest patents is an "Automatic in situ pellicle height measurement system." This innovative method involves measuring the thickness of a photolithography element, such as a pellicle, by projecting a light beam from various planes above and below the pellicle. The light beams are detected at the second side, allowing for the determination of the pellicle's thickness based on the generated indexes. Another significant patent is the "Check abnormal contact and via holes by electroplating method." This invention utilizes a cathode-anode apparatus to identify defective contacts or vias in semiconductor surfaces by applying a positive DC voltage to a copper plate immersed in a CuSO₄-H₂O solution.
Career Highlights
Ming-Chun Chou has worked with prominent companies in the semiconductor industry, including Taiwan Semiconductor Manufacturing Company and WaferTech, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas.
Collaborations
Chou has collaborated with talented individuals such as Huai-Jen Shu and Chia-Fang Wu. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.
Conclusion
Ming-Chun Chou's contributions to the field of photolithography and semiconductor technology are noteworthy. His innovative patents and collaborations highlight his dedication to advancing technology in this critical industry.