Hsinchu, Taiwan

Ming-Cheng Liang

This inventor holds 2 USPTO granted patents. Top assignee: Etron Technology, Inc.. Active years: 2011-2015.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011-2015

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2 patents (USPTO):Explore Patents

Title: The Innovations of Ming-Cheng Liang

Introduction

Ming-Cheng Liang is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of chip technology, holding a total of 2 patents. His work focuses on improving the efficiency and effectiveness of chip testing processes.

Latest Patents

Liang's latest patents include a "Chip capable of improving test coverage of pads and related method thereof." This invention outlines a method for enhancing test coverage of pads on a chip, which involves a control unit, multiple pads, and a storage unit. The process includes writing test data to a predetermined block, controlling pads to read and store data, and determining the success of the first pad.

Another significant patent is the "Chip testing circuit," which introduces a circuit designed to increase testing throughput. This circuit utilizes a multiplexer to switch connections between data compressing base units, thereby enhancing the testing throughput through a single interface circuit.

Career Highlights

Ming-Cheng Liang is currently employed at Etron Technology, Inc., where he continues to innovate in the field of chip technology. His work has been instrumental in advancing testing methodologies and improving chip performance.

Collaborations

Liang collaborates with esteemed colleagues such as Der-Min Yuan and Kuo-Hua Lee, contributing to a dynamic and innovative work environment.

Conclusion

Ming-Cheng Liang's contributions to chip technology through his patents and collaborative efforts highlight his role as a key innovator in the industry. His work continues to pave the way for advancements in chip testing and performance.

Profile summary based on public USPTO records.
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