Ming Chen

Title: Innovations by Inventor Ming Chen

Introduction

Ming Chen is an accomplished inventor based in Mission Viejo, CA (US). He has made significant contributions to the field of semiconductor technology. His innovative work focuses on improving the reliability of CMOS SRAMs through advanced testing methods.

Latest Patents

Ming Chen holds a patent for a "System and method to screen defect related reliability failures in CMOS SRAMs." This patent describes a method for testing a semiconductor wafer. An array of probes is coupled to the semiconductor wafer. A voltage difference is applied across a plurality of adjacent metal line pairs, such as wordline and/or bitline pairs, of one or more SRAM arrays of at least one die. The application of the voltage difference induces failure of metal stringers or defects between the adjacent lines. Additionally, the voltage can be applied across respective pairs of substantially all parallel metal lines of the one or more SRAM arrays of more than one die of the semiconductor wafer. This innovative approach enhances the reliability of semiconductor devices.

Career Highlights

Ming Chen is currently employed at Broadcom Corporation, a leading technology company known for its semiconductor solutions. His work at Broadcom has allowed him to contribute to cutting-edge technologies in the semiconductor industry. With a focus on reliability testing, he has played a vital role in advancing the performance of semiconductor devices.

Collaborations

Ming Chen collaborates with talented professionals in his field, including Surya Battacharya and Guang-Jye Shiau. These collaborations foster innovation and drive advancements in semiconductor technology.

Conclusion

Ming Chen's contributions to the field of semiconductor technology through his innovative patent and work at Broadcom Corporation highlight his role as a significant inventor. His efforts in enhancing the reliability of CMOS SRAMs demonstrate the importance of innovation in the technology sector.