Lanzhou, China

Min Yang

This inventor holds 1 USPTO granted patent. Top assignee: Lanzhou Jiaotong University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Yang. Retrieved from https://idiyas.com/inventor/min-yang-p75aha0f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Min Yang: Innovator in Digital Elevation Model Generation

Introduction

Min Yang is a prominent inventor based in Lanzhou, China. He has made significant contributions to the field of digital elevation modeling. His innovative approach focuses on enhancing the accuracy and efficiency of terrain analysis.

Latest Patents

Min Yang holds a patent for a "Method for multi-scale digital elevation model generation based on curvature wavelet transform." This method involves several steps, including obtaining a wavelet basis function and determining the wavelet decomposition layer number. The process also includes acquiring DEM-related parameter feature information and output resolution. The grid surface curvature of DEM data is decomposed and reconstructed using the wavelet basis function, leading to the extraction of terrain feature points. Ultimately, this method allows for effective DEM generation and synthesis.

Career Highlights

Min Yang is affiliated with Lanzhou Jiaotong University, where he continues to advance research in digital elevation modeling. His work has garnered attention for its innovative techniques and practical applications in various fields.

Collaborations

Min Yang collaborates with notable colleagues, including Jingzhong Li and Ben Ma. Their combined expertise contributes to the advancement of research in their respective areas.

Conclusion

Min Yang's contributions to digital elevation model generation highlight his innovative spirit and dedication to advancing technology. His work continues to influence the field and inspire future research endeavors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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