The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2025
Filed:
May. 13, 2025
Lanzhou Jiaotong University, Lanzhou, CN;
Jingzhong Li, Lanzhou, CN;
Ben Ma, Lanzhou, CN;
Haowen Yan, Lanzhou, CN;
Min Deng, Lanzhou, CN;
Shihong Du, Lanzhou, CN;
Liang Wu, Lanzhou, CN;
Min Yang, Lanzhou, CN;
Lanzhou Jiaotong University, Lanzhou, CN;
Abstract
A multi-scale DEM generation method based on curvature wavelet transform is provided. The method includes following steps: obtaining a wavelet basis function and a wavelet decomposition layer number of the curvature wavelet transform, and a DEM related parameter feature information amount and an output resolution; an grid surface curvature of DEM data is acquired, and the grid surface curvature of the DEM data is decomposed and reconstructed based on the wavelet basis function and the wavelet decomposition layer number to obtain a reconstruction matrix; based on the reconstruction matrix, terrain feature points in the DEM data are extracted by taking a feature information amount as a threshold; and based on the terrain feature points in the DEM data, resampling is performed with the output resolution as resolution, so that DEM generation and synthesis are realized.