Lanzhou, China

Min Deng

This inventor holds 1 USPTO granted patent. Top assignee: Lanzhou Jiaotong University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Deng. Retrieved from https://idiyas.com/inventor/min-deng-14g1ocmd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Min Deng: Innovator in Digital Elevation Model Generation

Introduction

Min Deng is a prominent inventor based in Lanzhou, China. He has made significant contributions to the field of digital elevation modeling. His innovative approach focuses on enhancing the accuracy and efficiency of terrain representation.

Latest Patents

Min Deng holds a patent titled "Method for multi-scale digital elevation model generation based on curvature wavelet transform." This patent describes a multi-scale DEM generation method that utilizes curvature wavelet transform. The method involves several steps, including obtaining a wavelet basis function and determining the wavelet decomposition layer number. It also includes acquiring DEM-related parameter feature information and output resolution. The process involves extracting terrain feature points and performing resampling to achieve effective DEM generation and synthesis. He has 1 patent to his name.

Career Highlights

Min Deng is affiliated with Lanzhou Jiaotong University, where he contributes to research and development in digital elevation modeling. His work has implications for various applications, including geography, urban planning, and environmental monitoring.

Collaborations

Min Deng has collaborated with notable colleagues, including Jingzhong Li and Ben Ma. Their combined expertise enhances the research output and innovation in their field.

Conclusion

Min Deng's contributions to digital elevation model generation demonstrate his commitment to advancing technology in this area. His innovative methods and collaborative efforts continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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