Suwon, South Korea

Min-suk Kim

This inventor holds 2 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2010-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min-suk Kim. Retrieved from https://idiyas.com/inventor/min-suk-kim-gnqdt1v3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2010-2011

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2 patents (USPTO):Explore Patents

Title: Min-suk Kim: Innovator in Semiconductor Process Evaluation

Introduction

Min-suk Kim is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology, holding 2 patents that focus on innovative evaluation methods.

Latest Patents

His latest patents include methods for semiconductor process evaluation that utilize variable ion implanting conditions. These methods involve performing multiple scans of a test semiconductor substrate, such as a test wafer, using ion beams under different ion implanting conditions. The parameters of the test semiconductor substrate are measured after scanning to conduct a thorough semiconductor process evaluation.

Career Highlights

Min-suk Kim is currently employed at Samsung Electronics Co., Ltd., where he continues to advance semiconductor technologies. His work is crucial in enhancing the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

He collaborates with notable colleagues, including Won-bae Jang and Seung-chul Kim, contributing to a dynamic team focused on innovation in semiconductor technology.

Conclusion

Min-suk Kim's work in semiconductor process evaluation showcases his dedication to advancing technology in this critical field. His contributions are vital for the ongoing development of efficient semiconductor manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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