This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Seoul National University. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Min Gyu Kim: Innovator in Thin Film Measurement Technology
Introduction
Min Gyu Kim is a notable inventor based in Cheongju-si, South Korea. He has made significant contributions to the field of measurement technology, particularly in the area of thin films. His innovative work has led to the development of a unique system that enhances the accuracy of measuring the thickness and physical properties of thin films.
Latest Patents
Min Gyu Kim holds a patent for a "System for measuring thickness and physical properties of thin film using spatial light modulator." This inventive concept includes several key components: a spatial light modulator, a first beam splitter, an objective lens, a second beam splitter, a first camera configured to acquire a surface image of the sample, an optical fiber equipped with a light receiving unit to receive reflected light passing through a certain area of a back focal plane of the objective lens, and a spectrometer configured to measure the intensity of light received from the optical fiber and output the measured intensity as an electrical signal. This patent showcases his expertise and innovative approach to solving complex measurement challenges.
Career Highlights
Min Gyu Kim is affiliated with Seoul National University, where he continues to advance his research and development efforts. His work at the university allows him to collaborate with other experts in the field and contribute to academic advancements in measurement technology.
Collaborations
He has worked alongside notable colleagues, including Heui Jae Pahk and Seung Woo Lee. Their collaborative efforts have further enriched the research environment and fostered innovation in their respective fields.
Conclusion
Min Gyu Kim's contributions to the field of thin film measurement technology exemplify the spirit of innovation. His patented system represents a significant advancement in measurement techniques, and his ongoing work at Seoul National University continues to inspire future developments in this area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile